ARAI, K., YAMASAKI, H., KAIHO, K., FURUSE, M., & NAKAGAWA, Y. (2007, January 1). Temperature characteristics of superconducting thin-film fault current limiting elements using high-resistivity alloy shunt layers. 17(2). New York, NY: Institute of Electrical and Electronics Engineers, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016622
ISO-690 (author-date, English)ARAI, Kazuaki, YAMASAKI, Hirofumi, KAIHO, Katsuyuki, FURUSE, Mitsuho and NAKAGAWA, Yoshihiko, 2007. Temperature characteristics of superconducting thin-film fault current limiting elements using high-resistivity alloy shunt layers. In: [online]. New York, NY: Institute of Electrical and Electronics Engineers, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016622
Modern Language Association 9th editionARAI, K., H. YAMASAKI, K. KAIHO, M. FURUSE, and Y. NAKAGAWA. Temperature characteristics of superconducting thin-film fault current limiting elements using high-resistivity alloy shunt layers. no. 2, New York, NY: Institute of Electrical and Electronics Engineers, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016622.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
ARAI, K., YAMASAKI, H., KAIHO, K., FURUSE, M. and NAKAGAWA, Y. (2007), “Temperature characteristics of superconducting thin-film fault current limiting elements using high-resistivity alloy shunt layers”, in , Vol. 17, New York, NY: Institute of Electrical and Electronics Engineers, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016622.