SHIRAI, Y., OHYA, M., IKUTA, R., SHIOTSU, M., & IMAGAWA, S. (2007, January 1). Transient stability of large helical device conductor with and without aluminum stabilizer (2)-numerical results. 17(2). New York, NY: Institute of Electrical and Electronics Engineers, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016773
ISO-690 (author-date, English)SHIRAI, Y, OHYA, M, IKUTA, R, SHIOTSU, M and IMAGAWA, S, 2007. Transient stability of large helical device conductor with and without aluminum stabilizer (2)-numerical results. In: [online]. New York, NY: Institute of Electrical and Electronics Engineers, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016773
Modern Language Association 9th editionSHIRAI, Y., M. OHYA, R. IKUTA, M. SHIOTSU, and S. IMAGAWA. Transient stability of large helical device conductor with and without aluminum stabilizer (2)-numerical results. no. 2, New York, NY: Institute of Electrical and Electronics Engineers, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016773.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
SHIRAI, Y., OHYA, M., IKUTA, R., SHIOTSU, M. and IMAGAWA, S. (2007), “Transient stability of large helical device conductor with and without aluminum stabilizer (2)-numerical results”, in , Vol. 17, New York, NY: Institute of Electrical and Electronics Engineers, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016773.