PAMIDI, S., NGUYEN, D., GUOMIN ZHANG, KNOLL, D., TROCIEWITZ, U., & SCHWARTZ, J. (2007, Januar 1). Variable temperature total AC loss and stability characterization facility. 17(2). New York, NY: Institute of Electrical and Electronics Engineers, 2007. Abgerufen von http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016977

PAMIDI, Sastry, NGUYEN, Doan, GUOMIN ZHANG, KNOLL, David, TROCIEWITZ, Ulf und SCHWARTZ, Justin, 2007. Variable temperature total AC loss and stability characterization facility. In: [online]. New York, NY: Institute of Electrical and Electronics Engineers, 2007. 1 Januar 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016977

PAMIDI, S., D. NGUYEN, GUOMIN ZHANG, D. KNOLL, U. TROCIEWITZ, und J. SCHWARTZ. Variable temperature total AC loss and stability characterization facility. Nr. 2, New York, NY: Institute of Electrical and Electronics Engineers, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016977.

PAMIDI, S., NGUYEN, D., GUOMIN ZHANG, KNOLL, D., TROCIEWITZ, U. und SCHWARTZ, J. (2007), „Variable temperature total AC loss and stability characterization facility“, in , Bd. 17, New York, NY: Institute of Electrical and Electronics Engineers, 2007., verfügbar unter: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016977.