PAMIDI, S., NGUYEN, D., GUOMIN ZHANG, KNOLL, D., TROCIEWITZ, U., & SCHWARTZ, J. (2007, January 1). Variable temperature total AC loss and stability characterization facility. 17(2). New York, NY: Institute of Electrical and Electronics Engineers, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016977
ISO-690 (author-date, English)PAMIDI, Sastry, NGUYEN, Doan, GUOMIN ZHANG, KNOLL, David, TROCIEWITZ, Ulf and SCHWARTZ, Justin, 2007. Variable temperature total AC loss and stability characterization facility. In: [online]. New York, NY: Institute of Electrical and Electronics Engineers, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016977
Modern Language Association 9th editionPAMIDI, S., D. NGUYEN, GUOMIN ZHANG, D. KNOLL, U. TROCIEWITZ, and J. SCHWARTZ. Variable temperature total AC loss and stability characterization facility. no. 2, New York, NY: Institute of Electrical and Electronics Engineers, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016977.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
PAMIDI, S., NGUYEN, D., GUOMIN ZHANG, KNOLL, D., TROCIEWITZ, U. and SCHWARTZ, J. (2007), “Variable temperature total AC loss and stability characterization facility”, in , Vol. 17, New York, NY: Institute of Electrical and Electronics Engineers, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016977.