SALLUZZO, M., DE LUCA, G. M., & VAGLIO, R. (2007, January 1). Thickness induced superconducting insulating transition in Nd1.2 Ba1.8 Cu3 Oz ultra-thin films. 17(2). New York, NY: Institute of Electrical and Electronics Engineers, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19017076
ISO-690 (author-date, English)SALLUZZO, M, DE LUCA, G. M and VAGLIO, R, 2007. Thickness induced superconducting insulating transition in Nd1.2 Ba1.8 Cu3 Oz ultra-thin films. In: [online]. New York, NY: Institute of Electrical and Electronics Engineers, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19017076
Modern Language Association 9th editionSALLUZZO, M., G. M. DE LUCA, and R. VAGLIO. Thickness induced superconducting insulating transition in Nd1.2 Ba1.8 Cu3 Oz ultra-thin films. no. 2, New York, NY: Institute of Electrical and Electronics Engineers, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19017076.
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SALLUZZO, M., DE LUCA, G.M. and VAGLIO, R. (2007), “Thickness induced superconducting insulating transition in Nd1.2 Ba1.8 Cu3 Oz ultra-thin films”, in , Vol. 17, New York, NY: Institute of Electrical and Electronics Engineers, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19017076.