VOUTSAS, A. T. (2007, Januar 1). The role of structural defects and texture variability in the performance of poly-Si thin film transistors. 515(19). Lausanne: Elsevier Science, 2007. Abgerufen von http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19031573

VOUTSAS, A. T, 2007. The role of structural defects and texture variability in the performance of poly-Si thin film transistors. In: [online]. Lausanne: Elsevier Science, 2007. 1 Januar 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19031573

VOUTSAS, A. T. The role of structural defects and texture variability in the performance of poly-Si thin film transistors. Nr. 19, Lausanne: Elsevier Science, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19031573.

VOUTSAS, A.T. (2007), „The role of structural defects and texture variability in the performance of poly-Si thin film transistors“, in , Bd. 515, Lausanne: Elsevier Science, 2007., verfügbar unter: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19031573.