VOUTSAS, A. T. (2007, January 1). The role of structural defects and texture variability in the performance of poly-Si thin film transistors. 515(19). Lausanne: Elsevier Science, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19031573
ISO-690 (author-date, English)VOUTSAS, A. T, 2007. The role of structural defects and texture variability in the performance of poly-Si thin film transistors. In: [online]. Lausanne: Elsevier Science, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19031573
Modern Language Association 9th editionVOUTSAS, A. T. The role of structural defects and texture variability in the performance of poly-Si thin film transistors. no. 19, Lausanne: Elsevier Science, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19031573.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
VOUTSAS, A.T. (2007), “The role of structural defects and texture variability in the performance of poly-Si thin film transistors”, in , Vol. 515, Lausanne: Elsevier Science, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19031573.