Result: Custom-Adaptive Kernel Strategies for Gaussian Process Regression in Wafer-Level Modeling and FPGA Delay Analysis
Title:
Custom-Adaptive Kernel Strategies for Gaussian Process Regression in Wafer-Level Modeling and FPGA Delay Analysis
Authors:
Mian, Riaz-ul-haqueAff1, Aff2, IDs10836025061808_cor1, Ahmed, Foisal, Hagihara, Yoshito, Yamane, Souma
Source:
Journal of Electronic Testing: Theory and Applications. :1-14
Database:
Springer Nature Journals