Mian, R.- ul- haque, Ahmed, F., Hagihara, Y., & Yamane, S. (2025). Custom-Adaptive Kernel Strategies for Gaussian Process Regression in Wafer-Level Modeling and FPGA Delay Analysis. Journal of Electronic Testing: Theory and Applications, 1-14. https://doi.org/10.1007/s10836-025-06180-8
ISO-690 (author-date, English)MIAN, Riaz-ul-haque, AHMED, Foisal, HAGIHARA, Yoshito und YAMANE, Souma, 2025. Custom-Adaptive Kernel Strategies for Gaussian Process Regression in Wafer-Level Modeling and FPGA Delay Analysis. Journal of Electronic Testing: Theory and Applications. 2 Juni 2025. P. 1-14. DOI 10.1007/s10836-025-06180-8.
Modern Language Association 9th editionMian, R.- ul- haque, F. Ahmed, Y. Hagihara, und S. Yamane. „Custom-Adaptive Kernel Strategies for Gaussian Process Regression in Wafer-Level Modeling and FPGA Delay Analysis“. Journal of Electronic Testing: Theory and Applications, Juni 2025, S. 1-14, https://doi.org/10.1007/s10836-025-06180-8.
Mohr Siebeck - Recht (Deutsch - Österreich)Mian, Riaz-ul-haque/Ahmed, Foisal/Hagihara, Yoshito/Yamane, Souma: Custom-Adaptive Kernel Strategies for Gaussian Process Regression in Wafer-Level Modeling and FPGA Delay Analysis, Journal of Electronic Testing: Theory and Applications 2025, 1-14.
Emerald - HarvardMian, R.- ul- haque, Ahmed, F., Hagihara, Y. und Yamane, S. (2025), „Custom-Adaptive Kernel Strategies for Gaussian Process Regression in Wafer-Level Modeling and FPGA Delay Analysis“, Journal of Electronic Testing: Theory and Applications, S. 1-14.