Result: Short Single-Fault Tests for Circuits in the Zhegalkin Basis with Arbitrary Stuck-At Faults of Gates

Title:
Short Single-Fault Tests for Circuits in the Zhegalkin Basis with Arbitrary Stuck-At Faults of Gates
Authors:
Popkov, K. A.Aff1, ID1100620253087_cor1
Source:
Mathematical Notes. 117(5-6):826-836
Database:
Springer Nature Journals