Popkov, K. A. (2025). Short Single-Fault Tests for Circuits in the Zhegalkin Basis with Arbitrary Stuck-At Faults of Gates. Mathematical Notes, 117(5-6), 826-836. https://doi.org/10.1134/s0001434625602813
ISO-690 (author-date, English)POPKOV, K. A., 2025. Short Single-Fault Tests for Circuits in the Zhegalkin Basis with Arbitrary Stuck-At Faults of Gates. Mathematical Notes. 1 June 2025. Vol. 117, no. 5-6, p. 826-836. DOI 10.1134/s0001434625602813.
Modern Language Association 9th editionPopkov, K. A. “Short Single-Fault Tests for Circuits in the Zhegalkin Basis With Arbitrary Stuck-At Faults of Gates”. Mathematical Notes, vol. 117, no. 5-6, June 2025, pp. 826-3, https://doi.org/10.1134/s0001434625602813.
Mohr Siebeck - Recht (Deutsch - Österreich)Popkov, K. A.: Short Single-Fault Tests for Circuits in the Zhegalkin Basis with Arbitrary Stuck-At Faults of Gates, Mathematical Notes 2025, 826-836.
Emerald - HarvardPopkov, K.A. (2025), “Short Single-Fault Tests for Circuits in the Zhegalkin Basis with Arbitrary Stuck-At Faults of Gates”, Mathematical Notes, Vol. 117 No. 5-6, pp. 826-836.