Result: Hybrid Wafer Defect Detection and Segmentation Using Verilog-Based Image Preprocessing and Deep Learning Architectures
Title:
Hybrid Wafer Defect Detection and Segmentation Using Verilog-Based Image Preprocessing and Deep Learning Architectures
Authors:
Naik, Bukke Chandrababu, Sevagan, S., Kamalakannan, Bharath, Derllinraj, N., Gopi, Varun P.Aff1, IDs1336902510870y_cor1
Source:
Arabian Journal for Science and Engineering. :1-16
Database:
Springer Nature Journals