Naik, B. C., Sevagan, S., Kamalakannan, B., Derllinraj, N., & Gopi, V. P. (2025). Hybrid Wafer Defect Detection and Segmentation Using Verilog-Based Image Preprocessing and Deep Learning Architectures. Arabian Journal for Science and Engineering, 1-16. https://doi.org/10.1007/s13369-025-10870-y
ISO-690 (author-date, English)NAIK, Bukke Chandrababu, SEVAGAN, S., KAMALAKANNAN, Bharath, DERLLINRAJ, N. und GOPI, Varun P., 2025. Hybrid Wafer Defect Detection and Segmentation Using Verilog-Based Image Preprocessing and Deep Learning Architectures. Arabian Journal for Science and Engineering. 25 November 2025. P. 1-16. DOI 10.1007/s13369-025-10870-y.
Modern Language Association 9th editionNaik, B. C., S. Sevagan, B. Kamalakannan, N. Derllinraj, und V. P. Gopi. „Hybrid Wafer Defect Detection and Segmentation Using Verilog-Based Image Preprocessing and Deep Learning Architectures“. Arabian Journal for Science and Engineering, November 2025, S. 1-16, https://doi.org/10.1007/s13369-025-10870-y.
Mohr Siebeck - Recht (Deutsch - Österreich)Naik, Bukke Chandrababu/Sevagan, S./Kamalakannan, Bharath/Derllinraj, N./Gopi, Varun P.: Hybrid Wafer Defect Detection and Segmentation Using Verilog-Based Image Preprocessing and Deep Learning Architectures, Arabian Journal for Science and Engineering 2025, 1-16.
Emerald - HarvardNaik, B.C., Sevagan, S., Kamalakannan, B., Derllinraj, N. und Gopi, V.P. (2025), „Hybrid Wafer Defect Detection and Segmentation Using Verilog-Based Image Preprocessing and Deep Learning Architectures“, Arabian Journal for Science and Engineering, S. 1-16.