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Treffer: Computer Analysis of AFM Images of a Silicon Surface Implanted with Zinc Ions and Oxidized at Elevated Temperatures

Title:
Computer Analysis of AFM Images of a Silicon Surface Implanted with Zinc Ions and Oxidized at Elevated Temperatures
Authors:
Sokolov, V. N., Razgulina, O. V., Privezentsev, V. V.Aff2, Aff4, cor3, Ksenich, S. V.
Source:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 13(4):734-739
Database:
Springer Nature Journals