Sokolov, V. N., Razgulina, O. V., Privezentsev, V. V., & Ksenich, S. V. (2019). Computer Analysis of AFM Images of a Silicon Surface Implanted with Zinc Ions and Oxidized at Elevated Temperatures. Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques, 13(4), 734-739. https://doi.org/10.1134/s1027451019040360

SOKOLOV, V. N., RAZGULINA, O. V., PRIVEZENTSEV, V. V. und KSENICH, S. V., 2019. Computer Analysis of AFM Images of a Silicon Surface Implanted with Zinc Ions and Oxidized at Elevated Temperatures. Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 1 Juli 2019. Vol. 13, no. 4, p. 734-739. DOI 10.1134/s1027451019040360.

Sokolov, V. N., O. V. Razgulina, V. V. Privezentsev, und S. V. Ksenich. „Computer Analysis of AFM Images of a Silicon Surface Implanted With Zinc Ions and Oxidized at Elevated Temperatures“. Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques, Bd. 13, Nr. 4, Juli 2019, S. 734-9, https://doi.org/10.1134/s1027451019040360.

Sokolov, V. N./Razgulina, O. V./Privezentsev, V. V./Ksenich, S. V.: Computer Analysis of AFM Images of a Silicon Surface Implanted with Zinc Ions and Oxidized at Elevated Temperatures, Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques 2019, 734-739.

Sokolov, V.N., Razgulina, O.V., Privezentsev, V.V. und Ksenich, S.V. (2019), „Computer Analysis of AFM Images of a Silicon Surface Implanted with Zinc Ions and Oxidized at Elevated Temperatures“, Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques, Vol. 13 No. 4, S. 734-739.