Keller, L., & Huth, M. (o. J.). Pattern generation for direct-write three-dimensional nanoscale structures via focused electron beam induced deposition [Electronic]. Beilstein journal of nanotechnology, (Band 9 (2018), Seite 2581-2598), , Seite 2581-2598. https://doi.org/10.3762/bjnano.9.240
ISO-690 (author-date, English)KELLER, Lukas und HUTH, Michael, [no date]. Pattern generation for direct-write three-dimensional nanoscale structures via focused electron beam induced deposition. Beilstein journal of nanotechnology. No. Band 9 (2018), Seite 2581-2598, p. , Seite 2581-2598. DOI 10.3762/bjnano.9.240.
Modern Language Association 9th editionKeller, L., und M. Huth. „Pattern generation for direct-write three-dimensional nanoscale structures via focused electron beam induced deposition“. Beilstein journal of nanotechnology, electronic, Nr. Band 9 (2018), Seite 2581-2598, Universitätsbibliothek Johann Christian Senckenberg Frankfurt, M. : Beilstein-Institut zur Förderung der Chemischen Wissenschaften, 2010-, S. , Seite 2581-2598, https://doi.org/10.3762/bjnano.9.240.
Mohr Siebeck - Recht (Deutsch - Österreich)Keller, Lukas/Huth, Michael: Pattern generation for direct-write three-dimensional nanoscale structures via focused electron beam induced deposition, Beilstein journal of nanotechnology , Seite 2581-2598.
Emerald - HarvardKeller, L. und Huth, M. (o. J.). „Pattern generation for direct-write three-dimensional nanoscale structures via focused electron beam induced deposition“, Beilstein journal of nanotechnology, Universitätsbibliothek Johann Christian Senckenberg Frankfurt, M. : Beilstein-Institut zur Förderung der Chemischen Wissenschaften, 2010-, Frankfurt am Main, No. Band 9 (2018), Seite 2581-2598, S. , Seite 2581-2598.