American Psychological Association 6th edition

BALDI, L., & BEZ, R. (2007, January 1). The scaling challenges of CMOS and the impact on high-density non-volatile memories. 13(2). Berlin: Springer, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18441748

ISO-690 (author-date, English)

BALDI, L and BEZ, Roberto, 2007. The scaling challenges of CMOS and the impact on high-density non-volatile memories. In: [online]. Berlin: Springer, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18441748

Modern Language Association 9th edition

BALDI, L., and R. BEZ. The scaling challenges of CMOS and the impact on high-density non-volatile memories. no. 2, Berlin: Springer, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18441748.

Mohr Siebeck - Recht (Deutsch - Österreich)

Emerald - Harvard

BALDI, L. and BEZ, R. (2007), “The scaling challenges of CMOS and the impact on high-density non-volatile memories”, in , Vol. 13, Berlin: Springer, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18441748.

Warning: These citations may not always be 100% accurate.