SCHOENFELDER, S., EBERT, M., LANDESBERGER, C., BOCK, K., & BAGDAHN, J. (2007, Januar 1). Investigations of the influence of dicing techniques on the strength properties of thin silicon. 47(2-3). Oxford: Elsevier, 2007. Abgerufen von http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18518710
ISO-690 (author-date, English)SCHOENFELDER, Stephan, EBERT, Matthias, LANDESBERGER, Christof, BOCK, Karlheinz und BAGDAHN, Jörg, 2007. Investigations of the influence of dicing techniques on the strength properties of thin silicon. In: [online]. Oxford: Elsevier, 2007. 1 Januar 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18518710
Modern Language Association 9th editionSCHOENFELDER, S., M. EBERT, C. LANDESBERGER, K. BOCK, und J. BAGDAHN. Investigations of the influence of dicing techniques on the strength properties of thin silicon. Nr. 2-3, Oxford: Elsevier, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18518710.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
SCHOENFELDER, S., EBERT, M., LANDESBERGER, C., BOCK, K. und BAGDAHN, J. (2007), „Investigations of the influence of dicing techniques on the strength properties of thin silicon“, in , Bd. 47, Oxford: Elsevier, 2007., verfügbar unter: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18518710.