SCHOENFELDER, S., EBERT, M., LANDESBERGER, C., BOCK, K., & BAGDAHN, J. (2007, January 1). Investigations of the influence of dicing techniques on the strength properties of thin silicon. 47(2-3). Oxford: Elsevier, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18518710
ISO-690 (author-date, English)SCHOENFELDER, Stephan, EBERT, Matthias, LANDESBERGER, Christof, BOCK, Karlheinz and BAGDAHN, Jörg, 2007. Investigations of the influence of dicing techniques on the strength properties of thin silicon. In: [online]. Oxford: Elsevier, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18518710
Modern Language Association 9th editionSCHOENFELDER, S., M. EBERT, C. LANDESBERGER, K. BOCK, and J. BAGDAHN. Investigations of the influence of dicing techniques on the strength properties of thin silicon. no. 2-3, Oxford: Elsevier, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18518710.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
SCHOENFELDER, S., EBERT, M., LANDESBERGER, C., BOCK, K. and BAGDAHN, J. (2007), “Investigations of the influence of dicing techniques on the strength properties of thin silicon”, in , Vol. 47, Oxford: Elsevier, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18518710.