XU, Q., WANG, B., IVANOV, A., & YOUNG, F. Y. (2007, Januar 1). Test scheduling for built-in self-tested embedded SRAMs with data retention faults. 1(3). Stevenage: Institution of Engineering and Technology, 2007. Abgerufen von http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18789659

XU, Q, WANG, B, IVANOV, A und YOUNG, F. Y, 2007. Test scheduling for built-in self-tested embedded SRAMs with data retention faults. In: [online]. Stevenage: Institution of Engineering and Technology, 2007. 1 Januar 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18789659

XU, Q., B. WANG, A. IVANOV, und F. Y. YOUNG. Test scheduling for built-in self-tested embedded SRAMs with data retention faults. Nr. 3, Stevenage: Institution of Engineering and Technology, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18789659.

XU, Q., WANG, B., IVANOV, A. und YOUNG, F.Y. (2007), „Test scheduling for built-in self-tested embedded SRAMs with data retention faults“, in , Bd. 1, Stevenage: Institution of Engineering and Technology, 2007., verfügbar unter: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18789659.