XU, Q., WANG, B., IVANOV, A., & YOUNG, F. Y. (2007, January 1). Test scheduling for built-in self-tested embedded SRAMs with data retention faults. 1(3). Stevenage: Institution of Engineering and Technology, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18789659
ISO-690 (author-date, English)XU, Q, WANG, B, IVANOV, A and YOUNG, F. Y, 2007. Test scheduling for built-in self-tested embedded SRAMs with data retention faults. In: [online]. Stevenage: Institution of Engineering and Technology, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18789659
Modern Language Association 9th editionXU, Q., B. WANG, A. IVANOV, and F. Y. YOUNG. Test scheduling for built-in self-tested embedded SRAMs with data retention faults. no. 3, Stevenage: Institution of Engineering and Technology, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18789659.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
XU, Q., WANG, B., IVANOV, A. and YOUNG, F.Y. (2007), “Test scheduling for built-in self-tested embedded SRAMs with data retention faults”, in , Vol. 1, Stevenage: Institution of Engineering and Technology, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18789659.