Liang, W., Jia, W., Shi, J., Xie, Z., Hu, Y., & Cao, W. (2025). Wafer sub-pixel alignment based on multi-scale residual channel attention network and multi-strategy improved sparrow search algorithm. The International Journal of Advanced Manufacturing Technology, 1-16. https://doi.org/10.1007/s00170-025-16237-9

LIANG, Wanyong, JIA, Weilin, SHI, Jun, XIE, Zehui, HU, Yangyang und CAO, Weifeng, 2025. Wafer sub-pixel alignment based on multi-scale residual channel attention network and multi-strategy improved sparrow search algorithm. The International Journal of Advanced Manufacturing Technology. 12 August 2025. P. 1-16. DOI 10.1007/s00170-025-16237-9.

Liang, W., W. Jia, J. Shi, Z. Xie, Y. Hu, und W. Cao. „Wafer Sub-Pixel Alignment Based on Multi-Scale Residual Channel Attention Network and Multi-Strategy Improved Sparrow Search Algorithm“. The International Journal of Advanced Manufacturing Technology, August 2025, S. 1-16, https://doi.org/10.1007/s00170-025-16237-9.

Liang, Wanyong/Jia, Weilin/Shi, Jun/Xie, Zehui/Hu, Yangyang/Cao, Weifeng: Wafer sub-pixel alignment based on multi-scale residual channel attention network and multi-strategy improved sparrow search algorithm, The International Journal of Advanced Manufacturing Technology 2025, 1-16.

Liang, W., Jia, W., Shi, J., Xie, Z., Hu, Y. und Cao, W. (2025), „Wafer sub-pixel alignment based on multi-scale residual channel attention network and multi-strategy improved sparrow search algorithm“, The International Journal of Advanced Manufacturing Technology, S. 1-16.